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Although a lot of research has been conducted in this area, leading to the implementation of a reliability simulation framework in each of the major commercial SPICE simulators, there are still a lot of deficiencies remaining also see Sect. Especially with the evolution to ever-smaller CMOS devices, statistical effects resulting from process variations and stochastic aging effects become more and more important.

On top of that, most academic and commercial simulators are limited to the simulation of rather small circuits. Accurate reliability evaluation of large analog or mixed-signal circuits is therefore still not possible. IC non-idealities such as process variations and transistor aging are a potential threat for the correct operation of integrated circuits. The latter are typically defined as the stress voltage for which the drain current or threshold voltage does not exceed a given reliability margin e.

In this work, the impact of transistor aging on analog circuits processed in a conventional nm CMOS process has been investigated. All important transistor aging effects have been studied and compact models for each important effect have been developed.


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Also, a circuit reliability simulation flow has been proposed. Finally, the flow has been applied to a set of analog circuits and the impact of aging has been studied.

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    Table of contents

    Compact Modeling. Gennady Gildenblat. Rino Micheloni. Krzysztof Iniewski. Dario Marra.

    Electrospinning for High Performance Sensors. Antonella Macagnano. Memristors and Memristive Systems. Ronald Tetzlaff. Waldemar Rebizant. Test and Diagnosis for Small-Delay Defects. Mohammad Tehranipoor. Advanced Microsystems for Automotive Applications Jan Fischer-Wolfarth. Kok Kiong Tan. Crosstalk in Modern On-Chip Interconnects. Mohab Anis. Nicu Bizon.

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    Hao Yu. Photonic Packaging Sourcebook. Ulrich H. Power Plants and Power Systems Control David Westwick. Marcus Quasthoff. Mustapha Hamdi. Currently, he is working as a research assistant at the ESAT? His research interests are in the development of systematic techniques and methodologies suited for implementation in analog CAD tools. Specific research topics include the modeling of A-to-D converters and of RF front-end architectures, and the high-level synthesis and architectural exploration of analog and mixedsignal systems. Several results have been described in various papers published in international journals and presented at multiple international conferences.

    Georges G.